Local electrochemical impedance spectroscopy (LEIS) has emerged as a technique to characterize local electrochemical processes on heterogeneous surfaces. However, current LEIS heavily relies on lock-in amplifiers that have a poor gain effect for weak currents, limiting the achievements of high-spatial imaging. Herein, an integrated scanning electrochemical cell microscopy is developed by directly collecting the alternating current (AC) signal through a preamplifier. The recorded local current (sub nA-level) is compared with the initial excitation signal to get the parameters for Nyquist plotting. By integrating this method into scanning electrochemical cell microscopy (SECCM), an image of LEIS at the Indium Tin Oxide/gold (ITO/Au) electrode is obtained with a spatial resolution of 180 nm. The established SECCM platform is integrated such that it could be positioned into the limited space (