Modern interferometry for length metrology : exploring limits and novel techniques

• Tác giả: Ren�e Sch�odel
• Ngôn ngữ: eng
• ISBN-13: 978-0750315760
• ISBN-13: 978-0750315777
• ISBN-13: 978-0750315784
• Ký hiệu phân loại: 530.8 Measurement
• Thông tin xuất bản: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, 2018
• Mô tả vật lý: 1 online resource (various pagings) : , illustrations (chiefly color).
• Bộ sưu tập: Tài liệu truy cập mở
• ID: 160860
• Chủ đề: 1. Interferometry; 2. Length measurement; 3. Applied physics; 4. SCIENCE / Physics / Optics & Light

Includes bibliographical references.

Tóm tắt

Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the fields of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units requires a measurement principle which establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and describes innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data and novel techniques enabling them to better apply and understand interferometry and length metrology.