Multiway Cluster Robust Double/Debiased Machine Learning

• Tác giả: Harold D Chiang, Kengo Kato, Yukun Ma, Yuya Sasaki
• Ngôn ngữ: eng
• Ký hiệu phân loại: 006.31 Machine learning
• Thông tin xuất bản: 2019
• Bộ sưu tập: Metadata
• ID: 163321

Tóm tắt

This paper investigates double/debiased machine learning (DML) under multiway clustered sampling environments. We propose a novel multiway cross fitting algorithm and a multiway DML estimator based on this algorithm. We also develop a multiway cluster robust standard error formula. Simulations indicate that the proposed procedure has favorable finite sample performance. Applying the proposed method to market share data for demand analysis, we obtain larger two-way cluster robust standard errors than non-robust ones.