Dependable Embedded Systems [electronic resource]

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Tác giả: Nikil Dutt, Jörg Henkel

Ngôn ngữ: ger

ISBN-13: 978-3030520175

Ký hiệu phân loại: 621.3815 Electrical, magnetic, optical, communications, computer engineering; electronics, lighting

Thông tin xuất bản: Cham : Springer International Publishing : Imprint: Springer, 2021

Mô tả vật lý: XIII, 608 p. 293 illus., 250 illus. in color. , online resource.

Bộ sưu tập: Tài liệu truy cập mở

ID: 169612

 This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems
  Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers
  Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
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