Impact of precursor dosing on the surface passivation of AZO/AlO

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Tác giả: Pietro P Altermatt, Ruy S Bonilla, Akash Dasgupta, Rebekah C Fraser, Theodore D C Hobson, Soumyajit Maitra, Shona McNab, Xinya Niu, John O'Sullivan, Anastasia H Soeriyadi, Jack E N Swallow, Yan Wang, Robert S Weatherup, Matthew Wright

Ngôn ngữ: eng

Ký hiệu phân loại: 959.3031 *Thailand

Thông tin xuất bản: England : Energy advances , 2025

Mô tả vật lý:

Bộ sưu tập: NCBI

ID: 171630

High-efficiency solar cell architectures, including silicon heterojunction (SHJ) and perovskite/silicon tandems, rely heavily on the unique properties of transparent conducting oxides (TCOs). The push towards terawatt-scale PV manufacturing means it is increasingly desirable to develop indium-free TCOs to facilitate the upscaled manufacturing of high-efficiency cell designs. Aluminium-doped ZnO (AZO) deposited by atomic layer deposition (ALD) has emerged as a promising candidate due to its combination of optical transparency and electrical conductivity. In addition, AZO has also been shown to passivate the c-Si surface. The ability for one material to provide all three properties without requiring any indium is advantageous in single junction and tandem solar devices. Herein, we demonstrate exceptional silicon surface passivation using AZO/AlO
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