Microplasticity of idealized single crystalline Ag cantilevers characterized with methods of high resolution

• Tác giả: Mark Wobrock
• Ngôn ngữ: eng
• ISBN-13: 978-3731506829
• ISBN: KSP/1000070130
• Ký hiệu phân loại: 502.82 Microscopy
• Thông tin xuất bản: Karlsruhe : KIT Scientific Publishing, 2017
• Mô tả vật lý: 1 electronic resource (XIII, 215 p. p.)
• Bộ sưu tập: Tài liệu truy cập mở
• ID: 203906

Tóm tắt

Single crystalline, µm-sized cantilevers are fabricated out of epitaxially grown Ag thin films by a lithography-based procedure and are deflected by a nanoindenter system. The microstructure of the plastically deformed cantile-vers is investigated using transmission Kikuchi diffraction (TKD) on the cantilever cross section. 3D discrete dislocation dynamics simulations (DDD) are performed for further analysis. A mechanism to explain the formation of dislocation networks upon loading is suggested.