Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

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Tác giả: Victor Bellitto

Ngôn ngữ: eng

ISBN-13: 978-9535149873

Ký hiệu phân loại: 230.08 Christianity Christian theology

Thông tin xuất bản: Croatia : IntechOpen, 2012

Mô tả vật lý: 1 electronic resource (270 p.)

Bộ sưu tập: Tài liệu truy cập mở

ID: 206658

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
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