Dealing with Missing Angular Sections in NanoCT Reconstructions of Low Contrast Polymeric Samples Employing a Mechanical In Situ Loading Stage.

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Tác giả: Martin Bastmeyer, Ben Breitung, Rafaela Debastiani, Peter Gumbsch, Chantal Miriam Kurpiers, Enrico Domenico Lemma, Ruth Schwaiger

Ngôn ngữ: eng

Ký hiệu phân loại: 968.91 *Zimbabwe

Thông tin xuất bản: United States : Microscopy research and technique , 2025

Mô tả vật lý:

Bộ sưu tập: NCBI

ID: 216109

While in situ experiments are gaining importance for the (mechanical) assessment of metamaterials or materials with complex microstructures, imaging conditions in such experiments are often challenging. The lab-based computed tomography system Xradia 810 Ultra allows for the in situ (time-lapsed) mechanical testing of samples. However, the in situ loading setup of this system limits the image acquisition angle to 140°. For low contrast polymeric materials, this limited acquisition angle leads to regions of low information gain, thus preventing an accurate reconstruction of the data using a filtered back projection algorithm resulting in erroneous microstructures. Here, we demonstrate how the information gain can be improved by selecting an appropriate position of the sample. A low contrast polymeric tetrahedral microlattice sample and a structured sample with specific markers, both scanned over 140° and 180°, demonstrate that the missing structural details in the 140° reconstruction are limited to an angular wedge of about 20°. Depending on the sample geometry and microstructure, applying simple strategies for the in situ experiments allows accurate reconstruction of the data. For the tetrahedral microlattice, a simple rotation of the sample by 90° rotates all relevant surfaces by about 30° to the original illumination direction, creating a more even X-ray illumination for all the projections, thus providing enough X-ray absorption for an accurate reconstruction of the geometry.
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