Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

• Tác giả: Mahtab Niknahad
• Ngôn ngữ: eng
• ISBN-13: 978-3731500384
• ISBN: KSP/1000035134
• Ký hiệu phân loại: 620 Engineering and allied operations
• Thông tin xuất bản: Karlsruhe : KIT Scientific Publishing, 2013
• Mô tả vật lý: 1 electronic resource (IX, 146 p. p.)
• Bộ sưu tập: Tài liệu truy cập mở
• ID: 223957

Tóm tắt

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.