X-ray Diffraction of Functional Materials

• Tác giả: Thomas Walter Cornelius, Souren Grigorian
• Ngôn ngữ: eng
• ISBN-13: 978-3036533650
• Thông tin xuất bản: Basel MDPI - Multidisciplinary Digital Publishing Institute 2022
• Mô tả vật lý: 1 electronic resource (188 p.)
• Bộ sưu tập: Tài liệu truy cập mở
• ID: 249171
• Chủ đề: 1. History of engineering & technology; 2. Materials science; 3. Technology: general issues

Tóm tắt

Demand for advanced X-ray scattering techniques has increased tremendously in recent years with the development of new functional materials. These characterizations have a huge impact on evaluating the microstructure and structure-property relation in functional materials. Thanks to its non-destructive character and adaptability to various environments, the X-ray is a powerful tool, being irreplaceable for novel in situ and operando studies. This book is dedicated to the latest advances in X-ray diffraction using both synchrotron radiation as well as laboratory sources for analyzing the microstructure and morphology in a broad range (organic, inorganic, hybrid, etc.) of functional materials.