Reliability Analysis of Electrotechnical Devices

• Tác giả: Cher Ming Tan
• Ngôn ngữ: eng
• ISBN-13: 978-3036546537
• Thông tin xuất bản: Basel : MDPI - Multidisciplinary Digital Publishing Institute, 2022
• Mô tả vật lý: 1 electronic resource (174 p.)
• Bộ sưu tập: Tài liệu truy cập mở
• ID: 270250
• Chủ đề: 1. 3D-IC (three-dimensional integrated circuit); 2. electromagnetic interference; 3. near field measurement; 4. History of engineering & technology; 5. Technology: general issues

Tóm tắt

This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.