Atomic Force Microscopy/Scanning Tunneling Microscopy 3 [electronic resource]

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Tác giả: Samuel H Cohen, Marcia L Lightbody

Ngôn ngữ:

ISBN-13: 978-0306470950

Ký hiệu phân loại: 620.112 Properties of materials and nondestructive testing

Thông tin xuất bản: New York, NY : Springer US : Imprint: Springer, 2002.

Mô tả vật lý: VIII, 210 p. 109 illus. , online resource.

Bộ sưu tập: Tài liệu truy cập mở

ID: 307526

 The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day's sessions papers were presented on general topics such as application of scanning probe microscopy in materials science
  STM and scanning tunneling spectroscopy of organic materials
  fractal analysis in AFM
  and nanomanipulation. Other papers presented included unexpected ordering of a molecule
  synthesis ofpeptides and oligonucleotides
  and analysis oflunar soils from Apollo 11.
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