Light Field Imaging for Deflectometry

• Tác giả: David Uhlig
• Ngôn ngữ: eng
• ISBN: KSP/1000159372
• Thông tin xuất bản: KIT Scientific Publishing 2023
• Mô tả vật lý: 1 electronic resource (284 p.)
• Bộ sưu tập: Tài liệu truy cập mở
• ID: 375935
• Chủ đề: 1. phase unwrapping; 2. camera calibration; 3. light field cameral Phasenentfaltung; 4. Kamerakalibrierung; 5. Lichtfeldkamera; 6. surface reconstruction; 7. deflectometry; 8. Oberflächenrekonstruktion; 9. Deflektometrie; 10. Electrical engineering

Tóm tắt

Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurement of specular surfaces. It presents improvements in phase unwrapping and calibration techniques, enabling high surface reconstruction accuracies using only a single monocular light field camera.