Dynamical Theory of Angle-Resolved Electron Energy Loss and Gain Spectroscopies of Phonons and Magnons in Transmission Electron Microscopy Including Multiple Scattering Effects.

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Tác giả: José Ángel Castellanos-Reyes, Ján Rusz, Paul M Zeiger

Ngôn ngữ: eng

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Thông tin xuất bản: United States : Physical review letters , 2025

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Bộ sưu tập: NCBI

ID: 4878

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We present a method for computing angle-resolved electron energy loss and gain spectroscopies for phonon and magnon excitations in transmission electron microscopy. Fractional scattering intensities are derived from the temperature-dependent time autocorrelation of the auxiliary electron beam wave function. This method captures both single and multiple scattering processes, as well as dynamical diffraction effects, while remaining computationally efficient and easy to parallelize.

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