Ultrathin Rare-Earth Oxyhalides as High-κ van der Waals Layered Dielectrics.

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Tác giả: Ruiqing Cheng, Xiaoqiang Feng, Jun He, Jian Jiang, Zijia Liu, Ximeng Peng, Fang Wang, Yao Wen, Lei Yin, Yiling Yu, Baoxing Zhai, Yanchang Zhou

Ngôn ngữ: eng

Ký hiệu phân loại: 537.24 Dielectrics

Thông tin xuất bản: Germany : Advanced materials (Deerfield Beach, Fla.) , 2025

Mô tả vật lý:

Bộ sưu tập: NCBI

ID: 689892

Van der Waals (vdW) dielectrics are extensively employed to enhance the performance of 2D electronic devices. However, current vdW dielectric materials still encounter challenges such as low dielectric constant (κ) and difficulties in synthesizing high-quality single crystals. 2D rare-earth oxyhalides (REOXs) with exceptional electrical properties present an opportunity for the exploration of novel high-κ dielectrics. In this study, for the first time, the synthesis of a series of van der Waals layered gadolinium oxyhalides with thicknesses down to monolayer through a space-confined vdW epitaxy approach and demonstrating their application as a single-crystalline gate dielectric is reported. It exhibits a remarkable relative dielectric constant exceeding 17 and an impressive breakdown field strength of 13.5 MV cm
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