Recently, interface scattering and low mobility have significantly impeded the performance of two-dimensional (2D) P-type transistors. 2D semiconductor tellurium (Te) has garnered significant interest owing to its unique atomic chain crystal structure, which confers ultrahigh hole mobility. van der Waals heterojunction enhances transistor performance by reducing scattering at the gate-channel interface, attributed to its high-quality interface. In this study, we present Te/gallium arsenide (GaAs) hybrid dimensional JFETs exhibiting sizable on-state currents, elevated transconductance, and mobility as high as 328.4 cm