Chromatic confocal measurement (CCM) is an extensive technique of confocal microscopy, where the inherent relation between the focused wavelength and the axial position enables depth sensing. Most CCM works by single-point, resulting in inevitable lateral scans for 3D measurement. To facilitate the process, a 3D measurement method was developed, characterized by combining depth obtained by chromatic confocal technique and lateral information obtained by DMD. To realize the field extension, an objective with hyper-chromatism and wide field was custom-designed to form a 16 × 16 × 5.2 mm