Application of ultra-weak photon emission imaging in plant stress assessment.

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Tác giả: Renuka Ramalingam Manoharan, Eliška Mihačová, Pavel Pospíšil, Ankush Prasad

Ngôn ngữ: eng

Ký hiệu phân loại:

Thông tin xuất bản: Japan : Journal of plant research , 2025

Mô tả vật lý:

Bộ sưu tập: NCBI

ID: 709599

The oxidative damage induced by abiotic stress factors such as salinity, drought, extreme temperatures, heavy metals, pollution, and high irradiance has been studied in Arabidopsis thaliana. Ultra-weak photon emission (UPE) is presented as a signature reflecting the extent of the oxidation process and/or damage. It can be used to predict the physiological state and general health of plants. This study presents an overview of a potential research platform where the technique can be applied. The results presented can aid in providing invaluable information for developing strategies to mitigate abiotic stress in crops by improving plant breeding programs with a focus on enhancing tolerance. This study evaluates the applicability of charged couple device (CCD) imaging in evaluating plant stress and degree of damage and to discuss the advantages and limitations of the claimed non-invasive label-free tool.
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