Long-term exposure to low-level crystalline silica and risk assessment of silicosis: a cohort study.

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Tác giả: Weihong Chen, Yanjun Guo, Wenzhen Li, Jixuan Ma, Dongming Wang, Min Zhou

Ngôn ngữ: eng

Ký hiệu phân loại: 531.3 Solid dynamics

Thông tin xuất bản: England : Thorax , 2025

Mô tả vật lý:

Bộ sưu tập: NCBI

ID: 718774

BACKGROUND: High-level exposure to crystalline silica dust is the key factor in silicosis. Long-term exposure to low-level silica dust, for example, lower than that in occupational exposure limits, still needs to be studied for their risk of silicosis. METHODS: A total of 30 697 workers were included from a cohort in China. Low-level silica dust exposure was defined as those having a lifetime mean silica dust concentration equal to or under permissible exposure limits, including 0.05 mg/m RESULTS: Among those with average exposure level equal to or lower than 0.05 mg/m CONCLUSION: Long-term exposure to low-level silica dust is still associated with a higher risk of silicosis. Control measurements and personal protective equipment should be emphasised to protect the health of workers.
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