Nitrogen vacancy diamond nanoparticles (NVNPs) are increasingly integrated with methods for optical detection of magnetic resonance (ODMR), providing new opportunities spanning the visualization of magnetic fields in microelectronic circuits, environmental sensing, and biology. However, only a small number of studies utilize aggregates of NVNPs for surface-wide magnetometry, with the fact that spin orientations in aggregate NVNPs are inherently misaligned, precluding proper magnetic field detection, compared with expensive monocrystalline diamonds. A post-processing method for layering NVNPs with aligned center orientations can potentially facilitate superior NV magnetometry by allowing sensitive detection with a simplified probe preparation. We present novel technology for creating densely stacked NVNP monolayers with inherent interlayer alignment for sensitive measurement of local field perturbations in microelectronic traces. We establish spatial characteristics of deposited aggregates and demonstrate their ability to capture dipoles from conducting microwires via ODMR. Our approach forms a novel accessible protocol that can be used for broad applications in micromagnetometry.